DB-FIB

Me ka holomua wikiwiki o nā mea uila semiconductor a me nā ʻenehana kaapuni i hoʻohui ʻia, ʻo ka piʻi ʻana o ka paʻakikī o nā hāmeʻa a me nā hale kaʻapuni i hāpai i nā koi no ka diagnostics chip process microelectronic, analysis failure, a me ka hana micro/nano.ʻO ka ʻōnaehana Dual Beam FIB-SEM, me kona mana machining precision a me ka hiki ke kālailai microscopic, ua lilo i mea nui i ka hoʻolālā microelectronic a me ka hana ʻana.

ʻO ka ʻōnaehana Dual Beam FIB-SEMhoʻohui pū i kahi Focused Ion Beam (FIB) a me kahi Scanning Electron Microscope (SEM). Hiki iā ia ke nānā pono SEM i nā kaʻina hana micromachining e pili ana i ka FIB, e hoʻohui ana i ka hoʻonā kiʻekiʻe spatial o ka kukuna electron me ka hiki ke hoʻololi pono i nā mea o ka ion beam.